[MassSpecGroup] Chang-Ching's Abstract

Freneil Jariwala fjariwal at stevens.edu
Thu Oct 28 08:56:05 EDT 2010


Here is Chang-Ching's Abstract:

A new desorption ionization technique, Desorption Ionization by Charge
Exchange
(DICE), has been developed and used to analyze compounds that do not ionize
well
by existing Electrospray-related desorption techniques, e.g. Desorption
Electrospray
Ionization (DESI). In the DICE technique, a nebulized spray containing
molecular ions
of a solvent such as toluene is generated by passing the solvent through a
stainless steel
capillary held at a high voltage. When the stream of charged droplets
produced in this
way is directed onto a solid surface, the analytes present on the surface
are desorbed and
ionized by a charge exchange process. This technique was shown to desorb and
generate
molecular ions from compounds that are not readily ionized by some other
ambient
methods, under positive-ion generation mode. In addition, DICE has shown to
generate
minimal metal cation adducts which some scientists would consider to be
spectral
complications. Another important feature about DICE is that it can be easily
combined
with DESI to broaden the range of compounds that can be analyzed by mass
spectrometry
within a single experiment since DICE works better for some compounds while
DESI
works better for other compounds. The combined technique could generate the
molecular
ion, proton and metal adduct from the same compound. When coupled to a
tandem mass
spectrometer, the combined source enables the generation of product ion
spectra of the
molecular ion and those of the [M + H]+ or [M + metal]+ ions of the same
compound,
without having to physically change the source from DICE to DESI. The
ability to record
CID spectra of both the molecular ion and adduct ions in a single mass
spectrometric
experiment adds a new dimension to the array of mass spectral methods
available for
structural studies.

-- 
Freneil Jariwala
Graduate Student
Department of Chemistry, Chemical Biology, and Biomedical Engineering
Stevens Institute of Technology
Hoboken, NJ 07030
fjariwal at stevens.edu
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